Fischione Instruments Model 1040 NanoMill
The Model 1040 NanoMill® TEM specimen preparation system enables preparation of ultra-thin, high-quality specimens necessary for advanced transmission electron microscopy (TEM) imaging and analysis. It provides a concentrated ultra-low-energy, inert argon ion beam for removal of amorphization, implantation or redeposition from specific areas of specimens produced by focused ion beam (FIB) milling. The system is also useful for the final thinning of conventionally prepared and FIB prepared TEM specimens. A liquid nitrogen-cooled stage allows processing of sensitive specimens at cryogenic conditions.
Main features
- Beam energy ranges from 50 eV up to 2000 eV
- Variable emission current
- Beam size approx. 2 μm
- Beam can be either targeted at a specific area or scanned over the specimen’s surface
- Real-time view of the specimen using the secondary electron signal allows precise targeting
- Room temperature or liquid nitrogen-cooled stage (−175°C for up to 6 h)
- Milling angle range from -10° to +30°
- Oil-free, dry vacuum system
Fischione Instruments Model 1040 NanoMill® at LSU SIF